MTE1302N1

Marktech Optoelectronics
193-MTE1302N1
MTE1302N1

Mfr.:

Description:
Infrared Emitters 1300nm SWIR Emitter 5mm Plastic Domed Lens

Lifecycle:
New Product:
New from this manufacturer.
ECAD Model:
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In Stock: 4

Stock:
4 Can Dispatch Immediately
Factory Lead Time:
8 Weeks Estimated factory production time for quantities greater than shown.
Minimum: 1   Multiples: 1
Unit Price:
Rp-
Ext. Price:
Rp-
Est. Tariff:

Pricing (IDR)

Qty. Unit Price
Ext. Price
Rp382.698 Rp382.698
Rp303.810 Rp3.038.100
Rp257.945 Rp25.794.500
Rp238.131 Rp119.065.500
1.000 Quote

Product Attribute Attribute Value Select Attribute
Marktech Optoelectronics
Product Category: Infrared Emitters
RoHS:  
Through Hole
1300 nm
50 mA
1.12 V
- 40 C
+ 85 C
Brand: Marktech Optoelectronics
Lens Shape: Dome
Product Type: IR Emitters (IR LEDs)
Series: SWIR
Factory Pack Quantity: 1
Subcategory: Infrared Data Communications
Tradename: SWIR Emitter
Viewing Angle: 26 deg
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Compliance Codes
CAHTS:
8541410000
USHTS:
8541410000
JPHTS:
854141000
TARIC:
8541410000
MXHTS:
8541410100
ECCN:
EAR99
Origin Classifications
Country of Origin:
United States
Assembly Country of Origin:
Not available
Country of Diffusion:
Not available
The country is subject to change at the time of shipment.

Short Wavelength Infrared Emitters

Marktech Optoelectronics Short Wavelength Infrared (SWIR) Emitters include both through-hole and surface-mount packages with wavelengths ranging from 1020nm to 1900nm. The SWIR emitters operate from 20mA to 350mA current range and are designed for high-power applications. These emitters consist of a high-output infrared die in a water-clear, 5mm plastic-molded package. Marktech Optoelectronics SWIR emitters offer high-speed light emission across spectral ranges not easily detected by standard detectors and are ideal for material and chemical analysis. Typical applications include optical switches, optical sensors, fiber-optic communication, biofluorescence and blood chemistry analysis, night vision, safety equipment, currency validation, fiber optics, and inspection systems.