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EVAL6491HB

Name: STMicroelectronics EVAL6491HB
Brand: STMicroelectronics
SKU: 511-EVAL6491HB
Price: 1762133 IDR
Availability: OutOfStock

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Mouser No:

511-EVAL6491HB

Mfr. No:

EVAL6491HB

Mfr.:

STMicroelectronics

Description:

Power Management IC Development Tools Demonstration board L6491 gate driver

Complete Your Design

Datasheet:

EVAL6491HB Datasheet (PDF)

More Information

Learn more about STMicroelectronics EVAL6491HB

Availability

Stock:: Non-Stocked

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Factory Lead Time:: 52 Weeks Estimated factory production time.

Long lead time reported on this product.

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Pricing (IDR)

Qty.	Unit Price	Ext. Price
	Rp1.762.133	Rp1.762.133

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Product Attribute	Attribute Value	Select Attribute
Manufacturer:	STMicroelectronics
Product Category:	Power Management IC Development Tools
RoHS:
Product:	Demonstration Boards
Type:	Gate Driver
Input Voltage:	3.3 V, 5 V
Output Voltage:	600 V
Tool Is For Evaluation Of:	L6491
Series:	EVAL6491HB
Brand:	STMicroelectronics
Description/Function:	Demonstration board for L6491 gate driver with smartSD
For Use With:	L6491
Packaging:	Bulk
Product Type:	Power Management IC Development Tools
Factory Pack Quantity:	1
Subcategory:	Development Tools
Unit Weight:	172,368 g

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Datasheet

EVAL6491HB Datasheet (PDF)

Product Catalogs

Demonstration board for L6491 gate driver with smartSD (PDF)

Compliance Codes

CNHTS:: 8543709990
CAHTS:: 9030820000
USHTS:: 9030820000
JPHTS:: 854239099
KRHTS:: 9030820000
TARIC:: 9030820000
MXHTS:: 9030820100
ECCN:: EAR99

Origin Classifications

Country of Origin:: Italy
Assembly Country of Origin:: Italy
Country of Diffusion:: Not available

The country is subject to change at the time of shipment.

EVAL6491HB Demonstration Board for L6491 Driver

STMicroelectronics EVAL6491HB Demonstration Board for L6491 Gate Driver evaluates all of the L6491 features while driving a power switch with voltage rating up to 600V in a TO-220 or TO-247 package. The board easily selects and modifies values relevant to external components in order to ease the driver's performance evaluation under different applicative conditions and fine pre-tuning of final application's components.