Texas Instruments SN74ACT3G97/Q1 Dual Configurable Data Flip-Flops

Texas Instruments SN74ACT3G97/Q1 Dual Configurable Data Flip-Flops incorporate three independent '97 function configurable logic gates with Schmitt trigger inputs. Each gate of the TI SN74ACT3G97/Q1 dual configurable data flip-flop can be set to perform a wide range of one- or two-input logic functions by tying unused inputs to either the supply voltage or ground.

The SN74ACT3G97-Q1 devices are AEC-Q100 qualified for automotive applications.

Features

  • AEC-Q100 qualified for automotive applications:
    • Device temperature grade 1 : -40° to +125°C
    • Device HBM ESD classification level 2
    • Device CDM ESD classification level C4B
  • Available in a wettable flank QFN package
  • Operating voltage range of 4.5V to 5.5V
  • TTL-compatible Schmitt-trigger inputs support slow and noisy input signals
  • Continuous ±24mA output drive at 5V
  • Supports up to ±75mA output drive at 5V in short bursts
  • Drives 50Q transmission lines
  • Fast operation with a delay of 12.2ns max

Applications

  • Combine power good signals
  • Combine enable signals
  • Eliminate slow or noisy input signals
  • Synchronize inverted clock inputs
  • Debounce a switch
  • Use fewer inputs to monitor error signals
  • Data selection
  • Multiplexing

Logic Diagram (Positive Logic)

Location Circuit - Texas Instruments SN74ACT3G97/Q1 Dual Configurable Data Flip-Flops
Published: 2026-01-07 | Updated: 2026-01-20