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Texas Instruments UCC5881-Q1 Gate Driver

Texas Instruments UCC5881-Q1 Gate Driver is an isolated, configurable, and adjustable drive strength gate driver designed to drive high-power SiC MOSFETs andIGBTs in EV/HEV applications. This driver integrates diagnostics and detection functions to simplify the design of ASIL-compliant systems. The UCC5881-Q1 includes an integrated 10-bit Analog-to-Digital Converter (ADC) that enables monitoring of up to 2 analog inputs, VCC2, DESAT, and the gate driver temperature. This driver supports primary-side and secondary-side Active Short Circuits (ASC). The UCC5881-Q1 offers under-voltage and over-voltage protection on internal and external supplies. This driver is AEC-Q100 qualified for automotive applications. The UCC5881-Q1 driver is used in applications such as HEV traction inverters and EV/HEV power modules.

Features

  • AEC-Q100 qualified:
    • Device temperature grade 1: -40°C to 125°C ambient operating temperature temperature
    • Device HBM ESD classification level 2
    • Device CDM ESD classification level C2b
  • Dual-output driver with real-time variable drive strength:
    • ±15A and ±5A drive current outputs
    • Digital input pins for drive strength adjustment without SPI
    • 3 resistor settings R1, R2, or R1||R2
    • Integrated 4A active Miller clamp or optional external drive for Miller clamp transistor
  • Primary-side and secondary-side Active Short Circuit (ASC) support
  • Under-voltage and over-voltage protection on internal and external supplies
  • Driver die temperature sensing and overtemperature protection
  • Short-circuit protection:
    • 110ns response time to DESAT event
    • DESAT protection - selections up to 14V
    • Shunt resistor-based Short-Circuit (SC) and Over-Current (OC) protection
    • Configurable protection threshold values and blanking times
    • Programmable Soft Turn-Off (STO) and Two-level Soft Turn-Off (2STO) current
  • Integrated 10-bit ADC:
    • Able to measure power switch temperature, DC Link voltage, driver die temperature, DESAT pin voltage, and VCC2 voltage
    • Programmable digital comparators
  • Advanced VCE/VDS clamping circuit
  • Functional safety-compliant:
    • Developed for functional safety applications
    • Documentation available to aid ISO 26262 system design up to ASIL D
  • Integrated diagnostics:
    • Built-In Self-Test (BIST) for protection comparators
    • Gate threshold voltage measurement for power device health monitoring
    • INP to transistor gate path integrity
    • Internal clock monitoring
    • Fault alarm and warning outputs
    • ISO communication data integrity check

Applications

  • Electric Vehicle (EV) and Hybrid Electric Vehicle (HEV) traction inverters
  • EV and HEV power modules

Schematic Diagram

Schematic - Texas Instruments UCC5881-Q1 Gate Driver

Additional Resource

Published: 2025-01-17 | Updated: 2025-05-06